TXEMM | MATERIALS · TESTING
Microwave Property Testing
RF & Microwave Electromagnetic Characterization
Complex permeability (μ′, μ″), complex permittivity (ε′, ε″), and S-parameter characterization for RF, microwave, EMI and advanced materials.
TXEMM | MATERIALS · TESTING
RF & Microwave Electromagnetic Characterization
Complex permeability (μ′, μ″), complex permittivity (ε′, ε″), and S-parameter characterization for RF, microwave, EMI and advanced materials.
Electromagnetic properties and signal response across RF and microwave frequencies.
μ′, μ″, magnetic loss
ε′, ε″, dielectric loss
S11, S21, reflection and transmission
Frequency-dependent absorption and loss
Select the appropriate fixture based on sample geometry and measurement frequency.
Resonant-frequency characterization
Complex μ* and ε* (0.5–12 GHz)
Specimen: plate, thickness < 3 mm
High accuracy at fixed resonances
DC magnetic bias (optional)
Broadband μ* and ε* extraction
Frequency range: 0.5–18 GHz
Specimen: ring (ID = 3 mm, OD = 7 mm)
High accuracy (typically < 2%)
Easy extraction of μ* and ε*
S-parameters: 0.5–14 GHz
Absorption, reflection, transmission
Complex μ* and ε*
Specimen: thin film, thickness < 10 μm
DC magnetic bias: 0–1000 Oe
Excellent for FMR studies
S-parameter spectra in bands:
S band: 2.60–3.95 GHz
G band: 3.95–5.85 GHz
C band: 5.85–8.20 GHz
X band: 8.20–12.4 GHz
Specimen: rectangular plate
High accuracy (μ′, ε′ < 2%, loss < 5%)