TXEMM | MATERIAL CHARACTERIZATION
High-Frequency Magnetic & Dielectric Testing
High-frequency characterization of complex permeability, permittivity, impedance, and material losses for RF, microwave, EMI, and electronic materials applications.
TXEMM provides high-frequency material and impedance characterization using the Keysight (Agilent/HP) E4991A.
Frequency range: 1 MHz – 3 GHz (impedance)
Material measurement: up to 1 GHz (with Option 002 & fixtures)
Basic impedance accuracy: ±0.8%
DC bias (Option 001): ±40 V or ±50 mA
Soft magnetic alloys (Fe-Ni, Fe-Co, Mu-metal)
Magnetic polymer composites and EMI materials
Inductors, cores, and high-frequency components
Dielectric and magnetic material development
