TXEMM | CONDUCTIVE MATERIALS CHARACTERIZATION · FRIT ANALYSIS
Isolate glass frits from conductive pastes for more targeted characterization.
TXEMM extracts and purifies glass frits from conductive pastes for composition, thermal, and high-temperature flow analysis.
Removing silver and organics first lets the analysis focus on the glass itself.
Starting material containing conductive particles, glass frits, organics, and additives.
Separate the glass frit fraction while reducing interference from other paste components.
03 Extracted Glass Frit
Recovered glass fraction for composition, thermal, and flow characterization.
Characterize recovered glass frit fractions through composition, thermal, thermomechanical, and high-temperature flow analysis.
Examine the morphology and microstructure of the recovered glass frit fraction.
SEM/TEM
Identify and compare the elemental composition of the recovered glass fraction.
ICP / XRF / SEM-EDS, as applicable
Evaluate glass transition, crystallization, and other thermal events.
Heat-flow and thermal-event profile
Evaluate deformation, spreading, and flow behavior under defined heating conditions.
Temperature-dependent shape response
