TXEMM | MATERIAL CHARACTERIZATION
Material Morphology & Composition Analysis
SEM, EDS & XRD Characterization
Microstructure, elemental composition and crystalline phase analysis for advanced materials.
TXEMM | MATERIAL CHARACTERIZATION
SEM, EDS & XRD Characterization
Microstructure, elemental composition and crystalline phase analysis for advanced materials.
Complementary techniques for understanding material morphology, composition and structure.
Surface morphology, particle geometry and microstructure
Element identification, composition and spatial distribution
Crystalline phase identification and crystal structure
High-resolution imaging of material surfaces and microstructures to evaluate particle morphology, grain features, surface defects, and material uniformity.
Surface morphology and microstructure observation
Particle size and shape evaluation
Surface defects and fracture features
Material and process comparison
EDS provides elemental identification and semi-quantitative composition analysis through characteristic X-rays generated during electron-beam examination.
Element identification and composition analysis
Localized elemental analysis
Elemental distribution mapping
Impurity and compositional variation investigation
XRD characterizes crystalline materials by analyzing diffraction patterns to identify crystal phases, evaluate structural changes, and investigate crystallinity.
Crystalline phase identification
Crystal structure evaluation
Phase transformation investigation
Crystallite size and lattice parameter analysis, where applicable